Synthesis and characterization of diperfluorooctyl-substituted phenylene-thiophene oligomers as n-type semiconductors. Molecular structure-film microstructure-mobility relationships, organic field-effect transistors, and transistor nonvolatile memory elements

Chemistry of Materials

Volumn 16, Issue 23, 2004, Pages 4715-4727

  Facchetti, Antonio ^a   Letizia, Joseph ^a   Yoon, Myung Han ^a   Mushrush, Melissa ^a   Katz, Howard E ^b   Marks, Tobin J ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EFFECT TRANSISTORS; MICROSTRUCTURE; NUCLEAR MAGNETIC RESONANCE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SPECTROSCOPIC ANALYSIS; SYNTHESIS (CHEMICAL); THIN FILMS; X RAY DIFFRACTION;

DEPOSITION TEMPERATURE; STABLE MEMORY EFFECTS; VACUUM DEPOSITED FILMS;

OLIGOMERS;

1,4 BIS[5 ( 4 N PERFLUOROOCTYLPHENYL) 2 THIENYL]BENZENE; 2,5 BIS(4 N PERFLUOROOCTYLPHENYL)THIOPHENE; 5,5 BIS(4 N PERFLUOROOCTYLPHENYL) 2,2 BIOTHIOPHENE; 5,5 BIS(4 N PERFLUOROOCTYLPHENYL) 2,5 QUARTERTHIOPHENE; 5,5 BIS(4 N PERFLUOROOCTYLPHENYL) 2,5 TERTHIOPHENE; OLIGOMER; THIOPHENE DERIVATIVE; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL STRUCTURE; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRIC FIELD; ELECTROPHORETIC MOBILITY; FILM; FLAME PHOTOMETRY; FLUORINATION; LIGHT ABSORPTION; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; SUBSTITUTION REACTION; SYNTHESIS; THERMOGRAVIMETRY; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION;

EID: 8444249278     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm0495008     Document Type: Article

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