Characterization of mhz pulse repetition rate femtosecond laser-irradiated gold-coated silicon surfaces

Nanoscale Research Letters

Volumn 6, Issue 1, 2011, Pages

  Sivakumar, Manickam ^a,b   Venkatakrishnan, Krishnan ^a   Tan, Bo ^a  

^a RYERSON UNIVERSITY   (Canada)

^b AMRITA SCHOOL OF ENGINEERING   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SHIFT; FEMTOSECOND LASERS; GOLD COATINGS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MOLTEN MATERIALS; NANOFIBERS; NANOPARTICLES; SCANNING ELECTRON MICROSCOPY; SILICIDES; SILICON ALLOYS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY POWDER DIFFRACTION; GOLD; SILICON; SURFACES; TRANSMISSION ELECTRON MICROSCOPY; ULTRASHORT PULSES; X RAY DIFFRACTION ANALYSIS;

AMBIENT CONDITIONS; INTERACTION TIME; IRRADIATED SPOTS; IRRADIATED SURFACE; PLASMA PRESSURES; SI NANOPARTICLES; SILICON SURFACES; X-RAY DIFFRACTION ANALYSES (XRD); FEMTOSECONDS; FLUENCES; GOLD SILICIDE; GOLD-COATED; PLASMA PLUMES; SELF-ASSEMBLED; SEM ANALYSIS; XPS SPECTRA; XRD; XRD PEAKS;

PULSE REPETITION RATE;

EID: 84255173471     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-6-78     Document Type: Article

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