Oxide-ion conductivity of highly c-axis-oriented apatite-type lanthanum silicate polycrystal formed by reactive diffusion between La 2SiO 5 and La 2Si 2O 7

Chemistry of Materials

Volumn 23, Issue 24, 2011, Pages 5474-5483

  Fukuda, Koichiro ^a   Asaka, Toru ^a   Hamaguchi, Ryuta ^a   Suzuki, Takahiro ^a   Oka, Hideki ^a   Berghout, Abid ^b   Béchade, Emilie ^b   Masson, Olivier ^b   Julien, Isabelle ^b   Champion, Eric ^b   Thomas, Philippe ^b  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^b UNIVERSITY OF LIMOGES   (France)

Author keywords

apatite; crystalline orientation; lanthanum silicates; oxide ion conductor; reactive diffusion

Indexed keywords

APATITE LAYERS; APATITE-TYPE; CRYSTALLINE ORIENTATION; DIFFUSION COUPLE; DIFFUSION DIRECTION; EMPIRICAL ACTIVATION ENERGY; IMPEDANCE SPECTROSCOPY; INTERFACIAL BOUNDARY; LANTHANUM SILICATES; MICRO RAMAN SPECTROSCOPY; MIGRATION ENERGY; OVERALL REACTIONS; OXIDE ION CONDUCTORS; OXIDE-ION CONDUCTIVITY; PRODUCT LAYER; REACTIVE DIFFUSION; VOLUME DIFFUSION;

ACTIVATION ENERGY; APATITE; DIFFUSION; ELECTRON PROBE MICROANALYSIS; IONS; LANTHANUM ALLOYS; LANTHANUM OXIDES; OPTICAL MICROSCOPY; POLYCRYSTALS; RAMAN SPECTROSCOPY; SILICATES; SILICON; X RAY DIFFRACTION ANALYSIS;

LANTHANUM;

EID: 84055192625     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm2029905     Document Type: Article

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