Crystal structure and electron density in the apatite-type ionic conductor La9.71(Si5.81Mg0.18)O26.37

Journal of Solid State Chemistry

Volumn 182, Issue 10, 2009, Pages 2846-2851

  Ali, Roushown ^a,b   Yashima, Masatomo ^b   Matsushita, Yoshitaka ^a   Yoshioka, Hideki ^c   Izumi, Fujio ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^c HYOGO PREFECTURAL INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Apatite type structure; Electron density distribution; MEM analysis; Rietveld refinement; Synchrotron X ray powder diffraction

Indexed keywords

APATITE-TYPE; APATITE-TYPE STRUCTURE; ATOMIC DISPLACEMENT PARAMETERS; CENTROSYMMETRIC; ELECTRON DENSITIES; ELECTRON DENSITY DISTRIBUTION; INTERSTITIAL SITES; IONIC CONDUCTOR; MAXIMUM ENTROPY METHODS; OXYGEN ATOM; OXYGEN IONS; SECOND HARMONIC GENERATION; SPACE GROUPS; SYNCHROTRON X-RAY POWDER DIFFRACTION; WHOLE-PATTERN FITTING;

APATITE; ATOMS; CARRIER CONCENTRATION; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON DENSITY MEASUREMENT; ELECTRONIC DENSITY OF STATES; ELECTRONS; HARMONIC GENERATION; IONIC CONDUCTIVITY; LANTHANUM; NONLINEAR OPTICS; OXYGEN; PHOSPHATE MINERALS; POWDERS; RIETVELD ANALYSIS; RIETVELD METHOD; SILICON; SYNCHROTRONS; X RAY ANALYSIS; X RAY POWDER DIFFRACTION;

RIETVELD REFINEMENT;

EID: 70349557901     PISSN: 00224596     EISSN: 1095726X     Source Type: Journal    
DOI: 10.1016/j.jssc.2009.07.053     Document Type: Article

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