Orientation dependence of transport property and microstructural characterization of Al-doped ZnO ceramics

Acta Materialia

Volumn 55, Issue 14, 2007, Pages 4753-4757

  Kaga, Hisashi ^a   Kinemuchi, Yoshiaki ^a   Yilmaz, Huseyin ^b   Watari, Koji ^a   Nakano, Hiromi ^c   Nakano, Hiroshi ^c   Tanaka, Satoshi ^d   Makiya, Atsushi ^d   Kato, Zenji ^d   Uematsu, Keizo ^d  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b GEBZE TECHNICAL UNIVERSITY   (Turkey)

^c RYUKOKU UNIVERSITY   (Japan)

^d NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

Electrical conductivity; Grain boundary structure; Magnetic anisotropy; Oxides; Texture

Indexed keywords

GRAIN BOUNDARY STRUCTURE; INTERFACIAL LAYERS; TEXTURE STRENGTHS;

ALUMINUM; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAGNETIC ANISOTROPY; MAGNETIC FIELD EFFECTS; MICROSTRUCTURAL EVOLUTION; THERMOELECTRICITY; TRANSPORT PROPERTIES; ZINC OXIDE;

CERAMIC MATERIALS;

EID: 34447319370     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2007.04.046     Document Type: Article

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