X-ray nanodiffraction of tilted domains in a poled epitaxial BiFeO 3 thin film

Applied Physics Letters

Volumn 99, Issue 23, 2011, Pages

  Hruszkewycz, S O ^a   Folkman, C M ^a,b   Highland, M J ^a   Holt, M V ^a   Baek, S H ^b   Streiffer, S K ^a   Baldo, P ^a   Eom, C B ^b   Fuoss, P H ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AS-GROWN; DOMAIN MORPHOLOGY; FOCUSED BEAMS; NANOSTRUCTURAL; THIN FILM FERROELECTRICS; TWIN WALLS; X-RAY NANODIFFRACTION;

ELECTRIC FIELDS; THIN FILMS;

DOMAIN WALLS;

EID: 83455228634     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3665627     Document Type: Article

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