Thermal profiling of photonic integrated circuits by thermoreflectance microscopy

Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006

Volumn , Issue , 2006, Pages

  Farzaneh, M ^a   Lüerßen, Dietrich ^a   Hudgings, Janice A ^a  

^a MOUNT HOLYOKE COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTONIC CIRCUITS; PHOTONIC INTEGRATED CIRCUITS; THERMAL PROFILING;

ELECTRON OPTICS; INTEGRATED CIRCUITS; INTEGRATED OPTOELECTRONICS; LASERS; LIGHT AMPLIFIERS; NETWORKS (CIRCUITS); OPTICAL WAVEGUIDES; OPTOELECTRONIC DEVICES; QUANTUM ELECTRONICS; SEMICONDUCTOR DEVICES;

SEMICONDUCTOR LASERS;

EID: 55649098416     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CLEO.2006.4628240     Document Type: Conference Paper

References (5)

1. K. P. Pipe and R. J. Ram, "Comprehensive heat exchange model for a semiconductor laser diode," IEEE Photon. Tech. Lett. 15, 504-506 (2003).
2. J. A. Hudgings, K. P. Pipe and R. J. Ram, "Thermal profiling for optical characterization of waveguide devices," Appl. Phys. Lett. 83, 3882-3884 (2003).
3. D. Lüerßen, R. J. Ram, A. hohl-AbiChedid, E. Clausen, Jr. and J. A. Hudgings, "Thermal profiling: Locating the onset of gain saturation in semiconductor optical amplifiers," IEEE Photon. Tech. Lett. 16, 1625-1627 (2004).
4. S. Grauby, B. C. Forget, S. Holé and D.. Fournier, "High resolution photothermal imaging of high frequency phenomena using a visible charge coupled device camera associated with a multichannel lock-in scheme," Rev. of Sci. Instr. 70, 3603-3608 (1999).
5. Dietrich Lüerßen, Janice A. Hudgings, Peter M. Mayer, and Rajeev J. Ram, "Nanoscale thermo-reflectance microscopy with 10mK temperature resolution using stochastic resonance," presented in the 21st Semi-Therm Conference, San Jose, CA, March 2005.