The effects of film thickness on the optical properties of TiO 2-SnO2 compound thin films

Physica Scripta

Volumn 84, Issue 6, 2011, Pages

  Sönmezolu, Savaş ^a   Arslan, Aysun ^b,c   Serin, Tülay ^c   Serin, Necmi ^c  

^a Karamanolu Mehmetbey University   (Turkey)

^b KASTAMONU UNIVERSITY   (Turkey)

^c ANKARA UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC CONSTANTS; DISPERSION BEHAVIOR; DISPERSION ENERGIES; ENVELOPE METHOD; EXTINCTION COEFFICIENTS; OPTICAL BANDS; OPTICAL NONLINEAR SUSCEPTIBILITY; PHYSICAL PARAMETERS; REFRACTIVE INDEX DISPERSION; SOL-GEL TECHNIQUE; STRUCTURAL EVOLUTION; TAUC MODEL; THICKNESS OF THE FILM; THIRD-ORDER; TIO; TRANSMITTANCE SPECTRA; WAVELENGTH RANGES; XRD ANALYSIS;

COMPOSITE FILMS; DIELECTRIC PROPERTIES; DISPERSION (WAVES); ENERGY GAP; OPTICAL BAND GAPS; OPTICAL CONSTANTS; REFRACTIVE INDEX; THIN FILMS; TITANIUM DIOXIDE; X RAY DIFFRACTION;

OPTICAL FILMS;

EID: 82955217290     PISSN: 00318949     EISSN: 14024896     Source Type: Journal    
DOI: 10.1088/0031-8949/84/06/065602     Document Type: Article

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