Detection of physical defects in solar cells by hyperspectral imaging technology

Optics and Laser Technology

Volumn 42, Issue 6, 2010, Pages 1010-1013

  Li, Qingli ^a   Wang, Weisheng ^a   Ma, Chao ^a   Zhu, Ziqiang ^a  

^a EAST CHINA NORMAL UNIVERSITY   (China)

Author keywords

Hyperspectral imaging; Material defect detection; Solar cell

Indexed keywords

BASIC PRINCIPLES; DESTRUCTIVE METHODS; FRACTURE DEFECTS; HYPERSPECTRAL IMAGING; HYPERSPECTRAL IMAGING SYSTEMS; KEY TECHNOLOGIES; LASER SCANNING; NON-CONTACT; PHYSICAL DEFECTS; SPECTRAL ANGLE MAPPERS;

DEFECTS; OPTOELECTRONIC DEVICES; SOLAR CELLS;

CRACK DETECTION;

EID: 77049106542     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlastec.2010.01.022     Document Type: Article

References (11)

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