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Volumn 520, Issue 4, 2011, Pages 1358-1362

Optical and structural properties of zinc oxide films with different thicknesses prepared by successive ionic layer adsorption and reaction method

Author keywords

Morphology; Optical properties; SILAR; X ray diffraction; Zinc oxide

Indexed keywords

ABSORPTION EDGES; BAND-GAP VALUES; DIRECT BAND GAP; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; GLASS SUBSTRATES; NUMBER OF CYCLES; OPTICAL ABSORPTION MEASUREMENT; OXIDE SEMICONDUCTING FILMS; RED SHIFT; ROOM TEMPERATURE; SILAR; SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS; ZNO FILMS;

EID: 82755171360     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.04.066     Document Type: Conference Paper
Times cited : (13)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.