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Volumn 520, Issue 4, 2011, Pages 1358-1362
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Optical and structural properties of zinc oxide films with different thicknesses prepared by successive ionic layer adsorption and reaction method
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Author keywords
Morphology; Optical properties; SILAR; X ray diffraction; Zinc oxide
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Indexed keywords
ABSORPTION EDGES;
BAND-GAP VALUES;
DIRECT BAND GAP;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
GLASS SUBSTRATES;
NUMBER OF CYCLES;
OPTICAL ABSORPTION MEASUREMENT;
OXIDE SEMICONDUCTING FILMS;
RED SHIFT;
ROOM TEMPERATURE;
SILAR;
SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS;
ZNO FILMS;
ADSORPTION;
CRYSTALLITE SIZE;
ENERGY GAP;
FIELD EMISSION MICROSCOPES;
MORPHOLOGY;
OPTICAL PROPERTIES;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING BISMUTH COMPOUNDS;
SEMICONDUCTING FILMS;
SEMICONDUCTING GLASS;
SUBSTRATES;
X RAY DIFFRACTION;
ZINC;
ZINC OXIDE;
OXIDE FILMS;
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EID: 82755171360
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2011.04.066 Document Type: Conference Paper |
Times cited : (13)
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References (23)
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