False discovery rate for scanning statistics

Biometrika

Volumn 98, Issue 4, 2011, Pages 979-985

  Siegmund, D O ^a   Zhang, N R ^a   Yakir, B ^b  

^a STANFORD UNIVERSITY   (United States)

^b HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

False discovery rate; Multiple comparisons; Poisson approximation; Scan statistic

Indexed keywords

EID: 82255192880     PISSN: 00063444     EISSN: 14643510     Source Type: Journal    
DOI: 10.1093/biomet/asr057     Document Type: Article

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