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Volumn 66, Issue 3-4, 2012, Pages 190-193
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Interrelationship between grain size-induced and strain-induced broadening of X-ray diffraction profiles: What we can learn about nanostructured materials?
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Author keywords
Ceramic thin films; Crystallization; Grain boundaries; Nanostructure; X ray diffraction
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Indexed keywords
CERAMIC THIN FILMS;
CRYSTALLIZATION PROCESS;
GD DOPED CERIA;
GRAIN SIZE;
INHOMOGENEITIES;
LATTICE DISORDERS;
LOCAL STRAINS;
PHENOMENOLOGICAL EQUATIONS;
STRAIN DISTRIBUTIONS;
CERIUM COMPOUNDS;
CRYSTALLIZATION;
GADOLINIUM;
GRAIN BOUNDARIES;
GRAIN SIZE AND SHAPE;
NANOSTRUCTURES;
X RAY DIFFRACTION;
POLYCRYSTALLINE MATERIALS;
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EID: 82255186575
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/j.scriptamat.2011.10.037 Document Type: Article |
Times cited : (21)
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References (19)
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