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Volumn 66, Issue 3-4, 2012, Pages 190-193

Interrelationship between grain size-induced and strain-induced broadening of X-ray diffraction profiles: What we can learn about nanostructured materials?

Author keywords

Ceramic thin films; Crystallization; Grain boundaries; Nanostructure; X ray diffraction

Indexed keywords

CERAMIC THIN FILMS; CRYSTALLIZATION PROCESS; GD DOPED CERIA; GRAIN SIZE; INHOMOGENEITIES; LATTICE DISORDERS; LOCAL STRAINS; PHENOMENOLOGICAL EQUATIONS; STRAIN DISTRIBUTIONS;

EID: 82255186575     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2011.10.037     Document Type: Article
Times cited : (21)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.