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Advanced Functional Materials

Volumn 20, Issue 17, 2010, Pages 2807-2814

Time-temperature-transformation (TTT) diagrams for crystallization of metal oxide thin films

(4) Rupp, Jennifer L M a Scherrer, Barbara a Schäuble, Nina a Gauckler, Ludwig J a

a ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS METALS; AMORPHOUS PHASE; CRYSTALLINITIES; CRYSTALLIZATION RATES; DEGREE OF CRYSTALLINITY; DOPED CERIA; ELECTRICAL PROPERTY; GADOLINIA; HIGHER TEMPERATURES; METAL OXIDE THIN FILMS; METAL OXIDES; OSTWALD RIPENING THEORY; PERCOLATION THRESHOLDS; PRIMARY CLUSTERS; RESISTIVE SENSOR; SINGLE GRAINS; TIME TEMPERATURE TRANSFORMATION DIAGRAMS; TTT DIAGRAM;

AMORPHOUS FILMS; CERIUM COMPOUNDS; CRYSTALLIZATION KINETICS; ELECTRIC PROPERTIES; FUEL CELLS; GLASS CERAMICS; GRAIN GROWTH; GRAPHIC METHODS; METAL OXIDE CERAMICS; METALLIC COMPOUNDS; METALLIC GLASS; METALS; OSTWALD RIPENING; OXIDE FILMS; SOLVENTS; SPRAY PYROLYSIS; THIN FILMS; VAPOR DEPOSITION;

PRECIPITATION (CHEMICAL);

EID: 77956318981 PISSN: 1616301X EISSN: 16163028 Source Type: Journal
DOI: 10.1002/adfm.201000377 Document Type: Article

Times cited : (43)

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