Twin wall distortions through structural investigation of epitaxial BiFeO3 thin films

Journal of Materials Research

Volumn 26, Issue 22, 2011, Pages 2844-2853

  Folkman, Chad M ^a   Baek, Seung Hyub ^a   Eom, Chang Beom ^a  

^a University of Wisconsin Madison   (United States)

Author keywords

Crystallographic structure; Epitaxy; Ferroelectric

Indexed keywords

AS-GROWN; BIFEO3 THIN FILM; CRYSTALLOGRAPHIC STRUCTURE; EPITAXIAL STRAIN; FERROELASTIC DOMAINS; FERROELECTRIC; GENERAL APPROACH; HIGH RESOLUTION; LATTICE ROTATIONS; MULTI DOMAINS; MULTIFERROICS; SINGLE-CRYSTAL SUBSTRATES; SPACE MAPPINGS; SRTIO; STRUCTURAL DETAILS; STRUCTURAL INVESTIGATION; TWIN WALLS;

EPITAXIAL GROWTH; SINGLE CRYSTALS; WALLS (STRUCTURAL PARTITIONS); X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

EPITAXIAL FILMS;

EID: 82055166146     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2011.327     Document Type: Article

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