Area detector corrections for high quality synchrotron X-ray structure factor measurements

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 662, Issue 1, 2012, Pages 61-70

  Skinner, Lawrie B ^a,b   Benmore, Chris J ^a   Parise, John B ^b,c  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b STONY BROOK UNIVERSITY   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Amorphous; Area detector; Corrections; X ray diffraction

Indexed keywords

AMORPHOUS MATERIALS; AMORPHOUS SILICON; GERMANIUM COMPOUNDS; GLASS; METALLIC GLASS; PIXELS; SELENIUM COMPOUNDS; SILICON DETECTORS; SYSTEMATIC ERRORS; X RAY DIFFRACTION;

AREA DETECTORS; CORRECTION PROCEDURE; CORRECTIONS; DATA NORMALIZATION; LARGE AREA DETECTOR; REDUCTION OF SYSTEMATIC ERRORS; RESPONSE CORRECTIONS; X-RAY STRUCTURE FACTOR;

X RAY DETECTORS;

EID: 81855161820     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2011.09.031     Document Type: Article

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