Applications of an amorphous silicon-based area detector for high-resolution, high-sensitivity and fast time-resolved pair distribution function measurements

Journal of Applied Crystallography

Volumn 40, Issue 3, 2007, Pages 463-470

  Chupas, Peter J ^a   Chapman, Karena W ^a   Lee, Peter L ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Area detectors; Diffraction; High resolution; High energy X rays; Pair distribution function; Synchrotron radiation; Time resolved studies

Indexed keywords

EID: 34249007781     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889807007856     Document Type: Article

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