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Volumn , Issue , 2011, Pages 211-213

Controlling strain in Ge on Si for EA modulators

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; CONTROL OPERATIONS; EA MODULATORS; EXTERNAL STRESS;

EID: 81355142869     PISSN: 19492081     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/GROUP4.2011.6053766     Document Type: Conference Paper
Times cited : (9)

References (11)
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    • Novel evanescent-coupled germanium electro-absorption modulator featuring monolithic integration with germanium p-i-n photodetector
    • A. E. J. Lim, T. Y. Liow, F. Qing, N. Duan, L. Ding, M. Yu, G. Q. Lo and D. L. Kwong, Novel evanescent-coupled germanium electro-absorption modulator featuring monolithic integration with germanium p-i-n photodetector, OPTIC EXPRESS, vol.19, pp.5040-5046, 2011
    • (2011) Optic Express , vol.19 , pp. 5040-5046
    • Lim, A.E.J.1    Liow, T.Y.2    Qing, F.3    Duan, N.4    Ding, L.5    Yu, M.6    Lo, G.Q.7    Kwong, D.L.8
  • 5
    • 19744378261 scopus 로고    scopus 로고
    • Micrometre-scale silicon electro-optic modulator
    • Q. Xu, B. Schmidt, S. Pradhan and M. Lipson, Micrometre-scale silicon electro-optic modulator, nature, vol.435, pp.325-327, 2005
    • (2005) Nature , vol.435 , pp. 325-327
    • Xu, Q.1    Schmidt, B.2    Pradhan, S.3    Lipson, M.4
  • 6
    • 22944463353 scopus 로고    scopus 로고
    • Strain-induced enhancement of near-infrared absorption in Ge epitaxial layers grown on Si substrate
    • Y. Ishikawa, K. Wada, J. Liu, D. D. Cannon, H. C. Luan, J. Michel and L. C. Kimerling, Strain-induced enhancement of near-infrared absorption in Ge epitaxial layers grown on Si substrate, J. Appl. Phys., Vol.98, 013501, 2005
    • (2005) J. Appl. Phys. , vol.98 , pp. 013501
    • Ishikawa, Y.1    Wada, K.2    Liu, J.3    Cannon, D.D.4    Luan, H.C.5    Michel, J.6    Kimerling, L.C.7
  • 8
    • 33750668607 scopus 로고
    • Band lineups and deformation potentials in the model-solid theory
    • Chris G. Van de Walle, Band lineups and deformation potentials in the model-solid theory, Phys. Rev. B, vol.39, pp.1871-1883, 1989
    • (1989) Phys. Rev. B , vol.39 , pp. 1871-1883
    • Van De Walle, C.G.1
  • 10
    • 0000736871 scopus 로고    scopus 로고
    • Stress measurements in silicon devices through Raman spectroscopy: Bridging the gap between theory and experiment
    • I. D. Wolf, H. E. Maes and S. K. Jones, Stress measurements in silicon devices through Raman spectroscopy: Bridging the gap between theory and experiment, J. Appl. Phys., vol.79, pp.7148-7156, 1996
    • (1996) J. Appl. Phys. , vol.79 , pp. 7148-7156
    • Wolf, I.D.1    Maes, H.E.2    Jones, S.K.3
  • 11
    • 0004643215 scopus 로고
    • Stress in Strained GeSi stripes: Calculation and determination from Raman measurements
    • S. C. Jain, B. Dietrich, H. Ritcher, A. Atlinson and A. H. Harker, Stress in Strained GeSi stripes: Calculation and determination from Raman measurements, Phys. Rev. B, vol.52, pp.6247-6253, 1995
    • (1995) Phys. Rev. B , vol.52 , pp. 6247-6253
    • Jain, S.C.1    Dietrich, B.2    Ritcher, H.3    Atlinson, A.4    Harker, A.H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.