A new resonance-based method for the measurement of nonmagnetic-conducting- sheet thickness

IEEE Transactions on Instrumentation and Measurement

Volumn 60, Issue 12, 2011, Pages 3892-3897

  Suresh, K ^a   Uma, G ^a   Umapathy, M ^a  

^a NATIONAL INSTITUTE OF TECHNOLOGY   (India)

Author keywords

Cantilever; eddy current; piezoelectric; resonant sensor; thickness measurement

Indexed keywords

CANTILEVER; MAGNETIC FORCE; MEASUREMENT SYSTEM; NONMAGNETICS; OSCILLATING MAGNETIC FIELDS; PIEZOELECTRIC; PIEZOELECTRIC EXCITATION; RESONANT SENSORS; RESONANT SYSTEMS; RESONATING STRUCTURES; SHEET THICKNESS;

EDDY CURRENT TESTING; EDDY CURRENTS; MEASUREMENTS; NANOCANTILEVERS; NATURAL FREQUENCIES; PERMANENT MAGNETS; PIEZOELECTRICITY; THICKNESS MEASUREMENT;

MAGNETIC FIELDS;

EID: 81255185586     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2011.2149350     Document Type: Article

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