A software tool for automatic analysis of selected area diffraction patterns within Digital Micrograph™

Ultramicroscopy

Volumn 112, Issue 1, 2012, Pages 10-14

  Wu, C H ^a   Reynolds, W T ^a   Murayama, M ^a,b  

^a Virginia Polytechnic Institute and State University   (United States)

^b VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

Image processing; Selected area diffraction pattern; TEM

Indexed keywords

EPITAXIAL GROWTH; FAST FOURIER TRANSFORMS; FORWARD SCATTERING; IMAGE PROCESSING; INTERFEROMETRY; ITERATIVE METHODS; MACROS; OPTICAL IMAGE STORAGE; SINGLE CRYSTALS; SUPERSATURATION; TRANSMISSION ELECTRON MICROSCOPY;

AUTOMATED MEASUREMENT; AUTOMATIC ANALYSIS; CROSS CORRELATIONS; DIFFRACTION SPOTS; DIGITAL MICROGRAPHS; HIGH RESOLUTION IMAGE; PATTERN ANALYSIS; SELECTED AREA DIFFRACTION PATTERNS;

DIFFRACTION PATTERNS;

ACCURACY; ALGORITHM; ANALYTIC METHOD; ARTICLE; COMPUTER PROGRAM; DIFFRACTION; FOURIER TRANSFORMATION; IMAGE PROCESSING; MEASUREMENT; SELECTED AREA DIFFRACTION PATTERN; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 80755150058     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.09.013     Document Type: Article

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