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Volumn 103, Issue 3, 2005, Pages 237-249
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Consistent indexing of a (set of) single crystal SAED pattern(s) with the ProcessDiffraction program
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Author keywords
Crystallography; Electron diffraction; Indexing; Tilting experiments
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Indexed keywords
CALIBRATION;
COMPOSITION;
COMPUTER SOFTWARE;
CRYSTAL STRUCTURE;
SINGLE CRYSTALS;
VECTORS;
X RAY DIFFRACTION;
COMPUTER PROGRAM-"PROCESSDIFFRACTION";
GONIOMETER SETTINGS;
SELECTED AREA ELECTRON DIFFRACTION (SAED);
TILTING;
ELECTRON DIFFRACTION;
ARTICLE;
CALIBRATION;
COMPUTER PROGRAM;
CRYSTAL STRUCTURE;
CRYSTALLOGRAPHY;
DATA BASE;
ELECTRON DIFFRACTION;
STRUCTURE ANALYSIS;
X RAY DIFFRACTION;
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EID: 17844382930
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2004.12.004 Document Type: Article |
Times cited : (283)
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References (15)
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