ZONES: A search/match database for single-crystal electron diffraction

Journal of Applied Crystallography

Volumn 35, Issue 5, 2002, Pages 552-555

  Hart, Haskell V ^a  

^a Shell Chemical Co   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CALCULATION; CHEMICAL ANALYSIS; CHEMISTRY; COMPUTER; CRYSTAL; DATA BASE; ELECTRON DIFFRACTION; FORENSIC SCIENCE; MATERIALS; METALLURGY; MINERALOGY;

EID: 0036790021     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889802009299     Document Type: Article

References (17)

1. Anderson, R., Mighell, A. D., Karen, V. L., Jenkins, R. & Carr, M. J. (1993). Microsc. Soc. Am. Bull. 23, 128-137.
2. Andrews, K. W., Dyson, D. J. & Keown, S. R. (1971). Interpretation of Electron Diffraction Patterns, 2nd ed., p. 41. London: Adam Hilger.
3. Booth, M., Gittos, M. & Wilkes, P. (1974). Metall. Trans. 5, 775-776.
4. Carr, M. J., Chambers, W. F. & Melgaard, D. (1986). Powder Diffr. 1, 226-234.
5. Carr, M. J., Chambers, W. F., Melgaard, D. K., Himes, V. L., Stalick, J. K. & Mighell, A. D. (1987). Natl Bur. Stand./Sandia/ICDD Electron Diffraction Database, National Technical Information Service. US Department of Commerce, Washington, DC, USA.
6. Carr, M. J., Chambers, W. F., Melgaard, D., Himes, V. L., Stalick, J. K. & Mighell, A. D. (1989). J. Res. Natl Inst. Stand. Technol. 94, 15-20.
7. Denley, D. R. & Hart, H. V. (2002). J. Appl. Cryst. 35, 546-551.
8. Goehner, R. P. & Prakask, R. (1977). Metallography, 10, 415-424.
9. Karen, V. L. & Mighell, A. D. (1992). Apparatus for Identifying and Comparing Lattice Structures and Determining Lattice Structure Symmetries. US Patent 5168457.
10. Karen, V. L. & Mighell, A. D. (1993). Apparatus and Methods for Identifying and Comparing Lattice Structures and Determining Lattice Structure Symmetries. US Patent 5 235 523.
11. Kasper, J. S. & Lonsdale K. (1972). Editors. International Tables for X-ray Crystallography, Vol. II, 3rd ed., p. 106. Birmingham: Knoch Press.
12. Lally, J. S. & Lee, R. J. (1977). Proceedings of the 35th Annual Meeting of the Electron Microscroscopy Society of America, pp. 22-23.
13. Lally, J. S. & Lee, R. J. (1978). Electron Microscroscopy and X-ray Applications. Environmental Occupational Health Analysis Second Symposium, pp. 169-174. Ann Arbor, Mich.: Ann Arbor Science.
14. Mighell, A. D., Himes, V. L., Anderson, R. & Carr, M. J. (1988). Proceedings of the 46th Annual Meeting of the Electron Microscopy Society of America, pp. 912-913.
15. Mighell, A. D. & Karen, V. L. (1990). J. Electron Microsc. Tech. 16, 155-159.
16. Mighell, A. & Karen, V. L. (1996). J. Res. Natl Inst. Stand. Techol. 101, 273-280.
17. Stalick, J. K. & Mighell, A. D. (1986). Crystal Data Version 1.0 Database Specifications. National Technical Note 1229. Washington, DC: National Bureau of Standards.