Imaging atoms and molecules on surfaces by scanning tunnelling microscopy

Journal of Physics D: Applied Physics

Volumn 44, Issue 46, 2011, Pages

  Chiang, Shirley ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; AU(1 1 1 ); HIGH RESOLUTION; HIGH-RESOLUTION IMAGING; HISTORICAL PERSPECTIVE; MATERIALS SYSTEMS; METAL-ON-METAL; SURFACE ALLOYS;

ATOMIC FORCE MICROSCOPY; METALS; MICA;

SCANNING TUNNELING MICROSCOPY;

EID: 80755143729     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/46/464001     Document Type: Article

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