4.4L: Late-news paper: A novel high reliable integrated gate driver with Bi-scanning structure using a-Si TFT for large size FHD TFT-LCD TVs

48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010

Volumn 1, Issue , 2010, Pages 35-38

  Shin, Hong Jae ^a   Park, Byung Hyun ^a   Son, Mi Young ^a   Kim, Byung Hoon ^a   Kim, Yong Ho ^a   Lee, Chung Ah ^a   Youn, Won Gyun ^a   Kim, Jeom Jae ^a   Oh, Chang Ho ^a   Kang, In Byeong ^a   Hwang, Yong Kee ^a  

^a LG Display Co Ltd   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

A-SI TFT; CONTROL CIRCUITS; GATE DRIVER CIRCUIT; GATE DRIVERS; HIGH RELIABLE; LARGE SIZES; LIFE-TIMES; NODE STRUCTURES; PERFORMANCE DEGRADATION; STRESS REDUCTION; TFT LCD PANELS; TFT-LCDS; TWO CHANNEL;

INTEGRATION; LIQUID CRYSTAL DISPLAYS; SCANNING; SILICON;

THIN FILM TRANSISTORS;

EID: 80755142642     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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5. W.B. Jackson, J.M. Marshall, M.D. Moyer, "Role of Hydrogen in the Formation of Metastable Defects in Hydrogenated Amorphous Silicon", Phys. Rev. B.39, p.1164, 1989.
6. H. Lebrun, N. Szydlo, E. Bidal, "Threshold-voltage Drift of Amorphous Silicon TFTs in Integrated Drivers for Active Matrix LCDs", J. of the SID 11/3, p.539, 2003.
7. S.Y. Yoon, Y.H. Jang, B. Kim, M.D. Chun, H.N. Cho, N.W. Cho, C.Y. Sohn, S.H. Jo, C.D. Kim, and I.J. Chung, "Highly Stable Integrated Gate Driver Circuit using a-Si TFT with Dull Pull-Down Structure", SID Digest, pp.348-351, 2005.