Late-news poster: Highly stable integrated gate driver circuit using a-Si TFT with dual pull-down structure

Digest of Technical Papers - SID International Symposium

Volumn 36, Issue 1, 2005, Pages 348-351

  Yoon, Soo Young ^a   Jang, Yong Ho ^a   Kim, Binn ^a   Chun, Min Doo ^a   Cho, Hyung Nyuck ^a   Cho, Nam Wook ^a   Sohn, Choong Yong ^a   Jo, Sung Hak ^a   Kirn, Chang Dong ^a   Chung, In Jae ^a  

^a LG Display Co Ltd   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; LIQUID CRYSTAL DISPLAYS; LOGIC GATES; RELIABILITY; SILICON; THIN FILM TRANSISTORS;

DUAL PULL-DOWN STRUCTURE; INTEGRATED GATE DRIVER CIRCUIT; NORMAL DRIVING CONDITIONS;

INTEGRATED CIRCUITS;

EID: 32144431780     PISSN: 0097966X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1889/1.2036443     Document Type: Conference Paper

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