Threshold-voltage drift of amorphous-silicon TFTs in integrated drivers for active-matrix LCDs

Journal of the Society for Information Display

Volumn 11, Issue 3 SPEC. ISS., 2003, Pages 539-542

  Lebrun, Hugues ^a   Szydlo, Nicolas ^a   Bidal, Eric ^a  

^a THALES   (France)

Author keywords

a Si TFTs; AMLCDs; Defects generation; Integrated drivers; Internal stress; Modeling; Threshold drift; Trapping

Indexed keywords

AMORPHOUS SILICON; CRYSTAL DEFECTS; LIQUID CRYSTAL DISPLAYS; MATHEMATICAL MODELS; STRESSES; THRESHOLD VOLTAGE;

THRESHOLD DRIFT;

THIN FILM TRANSISTORS;

EID: 0242581348     PISSN: 10710922     EISSN: None     Source Type: Journal    
DOI: 10.1889/1.1825683     Document Type: Conference Paper

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