Focusing elements and design considerations for a scanning helium microscope (SHeM)

Surface Review and Letters

Volumn 10, Issue 2-3, 2003, Pages 249-255

  Maclaren, D A ^a   Holst, B ^a,b   Riley, D J ^a   Allison, W ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b MAX PLANCK INSTITUTE FOR DYNAMICS AND SELF ORGANIZATION   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; HELIUM; MICROSTRUCTURE; MIRRORS; SCANNING; SILICON;

CONTRAST MECHANISMS;

MICROSCOPES;

HELIUM; SILICON;

ATOM; CONFERENCE PAPER; DEVICE; ENERGY; MIRROR; SCANNING ELECTRON MICROSCOPE; SCANNING HELIUM MICROSCOPE; SURFACE PROPERTY;

EID: 0042415657     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0218625x03005062     Document Type: Conference Paper

References (31)

1. D. P. Woodruff and T. A. Delchar, Modern Techniques of Surface Science (2nd Edition, Cambridge University Press, U.K., 1994).
2. D. E. Newbury, D. C. Jay, P. Echlin, C. E. Fiori and J. I. Goldstein, Advanced Scanning Electron Microscopy and X-Ray Microanalysis (Plenum Press, New York, 1986).
3. D. Farías and K. Reider, Rep. Prog. Phys. 61, 1575 (1998).
4. K. D. Jandt, Surf. Sci. 491, 303 (2001).
5. N. Camillone III, C. E. D. Chidsey, G. Liu and G. Scoles, J. Chem. Phys. 98, 3503 (1993).
6. H. Seiler, J. Appl. Phys. 54, R1 (1983).
7. N. W. Ashcroft and N. D. Mermin, Solid State Physics (Saunders College Publishing, Florida, 1976).
8. S. Foulias, N. J. Curson, M. C. Cowen and W. Allison, Surf. Sci. 331-333, 522 (1995).
9. C. S. Adams, M. Sigel and J. Mlynek, Phys. Rep. 240, 143 (1994).
10. A. P. Jardine, P. Fouquet, J. Ellis and W. Allison, Rev. Sci. Instrum. 72, 3834 (2001).
11. T. Pfau, S. Spälter, Ch. Kurtseifer, C. R. Ekstrom and J. Mlynek, Phys. Rev. Lett. 73, 1223 (1994).
12. O. Carnal, M. Sigel, T. Sleator, H. Takuma and J. Mlynek, Phys. Rev. Lett. 67, 3231 (1991).
13. R. B. Doak, R. E. Grisenti, S. Rehbein, G. Schmal, J. P. Toennies and Ch. Wöll, Phys. Rev. Lett. 83, 4229 (1999).
14. T. M. Roach, H. Abele, M. G. Boshier, H. L. Grossman, K. P. Zetie and E. A. Hinds, Phys. Rev. Lett. 75, 629 (1995).
15. J. J. Berkhout, O. J. Luiten, I. D. Setja, T. W. Hijmans, T. Mizusake and J. T. M. Walraven, Phys. Rev. Lett. 63, 1689 (1989).
16. V. G. Lupov, W. A. Kaufman, K. M. Hill, R. S. Raymond and A. D. Krisch, Phys. Rev. Lett. 71, 2405 (1993).
17. R. B. Doak, Optical Society of America Technical Digest 15, 250 (1989).
18. B. Holst and W. Allison, Nature (London) 390, 244 (1997).
19. D. Korsch, Reflective Optics (Academic Press, London, 1991).
20. D. A. MacLaren, W. Allison and B. Holst, Rev. Sci. Instrum. 71, 2625 (2000).
21. D. A. MacLaren, H. T. Goldrein and W. Allison, 2002 (to be published).
22. C. Henkel, K. Molmer, R. Kaiser, N. Vansteenkiste, C. I. Westbrook and A. Aspect, Phys. Rev. A55, 1160 (1997).
23. B. Holst and W. Allison, in Atomic and Molecular Beams - The State of the Art 2000 (Springer-Verlag, Berlin, 2000).
24. J. R. Buckland, B. Holst and W. Allison, Chem. Phys. Lett. 303, 107 (1999).
25. D. A. MacLaren, N. J. Curson, P. Atkinson, B. Holst, D. J. Johnson and W. Allison, J. Vac. Sci. Technol. A20, 285 (2002).
26. D. A. MacLaren, N. J. Curson, P. Atkinson and W. Allison, Surf. Sci. 490, 285 (2001).
27. J. R. B. Knowling, Ph. D. Thesis, University of Cambridge, 1999.
28. A. Wicki, V. Marsico, K. Kuhnke and K. Kerne, Rev. Sci. Instrum. 70, 3562 (1999).
29. J. W. McWane and D. E. Oates, Rev. Sci. Instrum. 45, 1145 (1974).
30. D. R. Miller, Atomic and Molecular Beam Methods, Vol. 1, Ch. 2 (Oxford University Press, Oxford, 1988).
31. J. Braun, P. K. Day, J. P. Toennies and G. Witte, Rev. Sci. Instrum. 68, 3001 (1997).