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Volumn 99, Issue 17, 2011, Pages

A coupled analysis of the piezoresponse force microscopy signals

Author keywords

[No Author keywords available]

Indexed keywords

COUPLED ANALYSIS; COUPLED THEORY; ISOTROPIC PIEZOELECTRIC MATERIALS; LINEAR RELATIONSHIPS; PIEZOELECTRIC COEFFICIENT; PIEZOELECTRIC FILM; PIEZORESPONSE FORCE MICROSCOPY;

EID: 80555154298     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3657143     Document Type: Article
Times cited : (11)

References (13)
  • 3
    • 0037085895 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.65.125408
    • S. V. Kalinin and D. A. Bonnell, Phys. Rev. B 65, 125408 (2002). 10.1103/PhysRevB.65.125408
    • (2002) Phys. Rev. B , vol.65 , pp. 125408
    • Kalinin, S.V.1    Bonnell, D.A.2
  • 10
    • 35348864362 scopus 로고    scopus 로고
    • The piezoresponse force microscopy of surface layers and thin films: Effective response and resolution function
    • DOI 10.1063/1.2785824
    • A. N. Morozovska, E. A. Eliseev, and S. V. Kalinin, J. Appl. Phys. 102, 074105 (2007). 10.1063/1.2785824 (Pubitemid 47587856)
    • (2007) Journal of Applied Physics , vol.102 , Issue.7 , pp. 074105
    • Morozovska, A.N.1    Eliseev, E.A.2    Kalinin, S.V.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.