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Volumn , Issue , 2011, Pages
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A 1.0V 45nm nonvolatile magnetic latch design and its robustness analysis
a a a b c c c |
Author keywords
[No Author keywords available]
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Indexed keywords
45NM TECHNOLOGY;
DESIGN TRADEOFF;
MAGNETIC LATCHES;
MAGNETIC TUNNELING JUNCTIONS;
NON-VOLATILE;
OPERATION ERRORS;
PROCESS VARIATION;
ROBUSTNESS ANALYSIS;
STANDBY MODE;
THERMAL FLUCTUATIONS;
WRITE OPERATIONS;
ELECTRIC NETWORK ANALYSIS;
ERRORS;
FLIP FLOP CIRCUITS;
INTEGRATED CIRCUIT MANUFACTURE;
INTEGRATED CIRCUITS;
MAGNETIC DEVICES;
DESIGN;
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EID: 80455129503
PISSN: 08865930
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/CICC.2011.6055392 Document Type: Conference Paper |
Times cited : (14)
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References (9)
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