Synthesis and X-ray photoelectron spectroscopy (XPS) and thermoelectric studies of ternary Bi2(Te0.5Se0.5)3 mixed-metal chalcogenide thin films by the arrested precipitation technique

Canadian Journal of Chemistry

Volumn 89, Issue 11, 2011, Pages 1375-1381

  Patil, S M ^a   Mane, S R ^a   Mane, R M ^a   Mali, S S ^a   Patil, P S ^a   Bhosale, P N ^a  

^a SHIVAJI UNIVERSITY   (India)

Author keywords

Chalcogenide thin films by APT; Thermoelectric study; XPS

Indexed keywords

ALKALINE MEDIUM; ANALYTICAL GRADES; AS-DEPOSITED FILMS; BISMUTH NITRATES; CHALCOGENIDE THIN FILMS; DEPOSITED FILMS; ELECTRICAL ANALYSIS; ELECTRICAL CONDUCTION; ENERGY DISPERSIVE X-RAY; N-TYPE SEMICONDUCTORS; NANOCRYSTALLINES; PRECIPITATION TECHNIQUES; PRECURSOR MATERIALS; RHOMBOHEDRAL STRUCTURES; SURFACE OXIDATIONS; THERMOELECTRIC FIGURE OF MERIT; THERMOELECTRIC STUDY; TRIETHANOLAMINES; WAVELENGTH REGIONS;

ABSORPTION; ABSORPTION SPECTROSCOPY; ALKALINITY; ATOMIC FORCE MICROSCOPY; BINDING ENERGY; BISMUTH; CHEMICAL ANALYSIS; LIGHT ABSORPTION; PHASE CHANGE MEMORY; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTONS; PRECIPITATION (CHEMICAL); SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; SODIUM; STOICHIOMETRY; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 80155213908     PISSN: 00084042     EISSN: None     Source Type: Journal    
DOI: 10.1139/v11-107     Document Type: Article

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