Quantitative phase and absorption tomography with an X-ray grating interferometer and synchrotron radiation

Physica Status Solidi (A) Applications and Materials Science

Volumn 208, Issue 11, 2011, Pages 2526-2532

  Zanette, I ^a   Weitkamp, T ^b   Lang, S ^c   Langer, M ^a,d   Mohr, J ^e   David, C ^f   Baruchel, J ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b SYNCHROTRON SOLEIL   (France)

^c UNIVERSITY OF BASEL   (Switzerland)

^d UNIVERSITÉ DE LYON   (France)

^e KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^f PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

phase wrapping; synchrotron radiation; X ray grating interferometer; X ray imaging; X ray tomography

Indexed keywords

ABSORPTION TOMOGRAPHY; ACCURACY AND PRECISION; CONTRAST TO NOISE RATIO; GRATING INTERFEROMETERS; IMAGE ARTIFACTS; IN-PHASE; MONOCHROMATIC SYNCHROTRON RADIATION; PHASE WRAPPING; PHASE-STEPPING TECHNIQUE; QUANTITATIVE ASSESSMENTS; X-RAY GRATING INTERFEROMETERS; X-RAY INTERFEROMETERS; X-RAY PHASE; X-RAY TOMOGRAPHY; XRAY IMAGING;

ABSORPTION; INTERFEROMETERS; REFRACTIVE INDEX; SYNCHROTRON RADIATION; SYNCHROTRONS; TOMOGRAPHY; X RAY ANALYSIS;

X RAYS;

EID: 80155205467     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201184276     Document Type: Article

References (16)

1. R. Fitzgerald, Phys. Today 53 (7), 23-27 (2000).
2. A. Momose, Jpn. J. Appl. Phys. 44, 6355-6367 (2005).
3. C. David, B. Nöhammer, H. H. Solak, and, E. Ziegler, Appl. Phys. Lett. 81, 3287-3289 (2002).
4. A. Momose, S. Kawamoto, I. Koyama, Y. Hamaishi, K. Takai, and, Y. Suzuki, Jpn. J. Appl. Phys. 42 (Part 2, No. 7B), L866-L868 (2003).
5. F. Pfeiffer, T. Weitkamp, O. Bunk, and, C. David, Nature Phys. 2, 258-261 (2006).
6. T. Weitkamp, I. Zanette, C. David, J. Baruchel, M. Bech, P. Bernard, H. Deyhle, T. Donath, J. Kenntner, S. Lang, J. Mohr, B. Müller, F. Pfeiffer, E. Reznikova, S. Rutishauser, G. Schulz, A. Tapfer, and, J. P. Valade, in: Developments in X-ray Tomography VII, edited by, S. R. Stock, Proc. SPIE, Vol. 7804 (SPIE, Bellingham, WA, USA, 2010), p. 780406.
7. T. Weitkamp, P. Tafforeau, E. Boller, P. Cloetens, J. P. Valade, P. Bernard, F. Peyrin, W. Ludwig, L. Helfen, and, J. Baruchel, in: X-ray Optics and Microanalysis: Proceedings of the 20th International Congress, edited by, M. Denecke, and, C. T. Walker, AIP Conf. Proc., Vol. 1221 (AIP, Melville, NY, USA, 2010), pp. 33-38.
8. J. Herzen, T. Donath, F. Pfeiffer, O. Bunk, C. Padeste, F. Beckmann, A. Schreyer, and, C. David, Opt. Express 17 (12), 10010-10018 (2009).
9. J. Zambelli, N. Bevins, Z. Qi, and, G. H. Chen, Med. Phys. 37 (6), 2473-2479 (2010).
10. T. Weitkamp, A. Diaz, C. David, F. Pfeiffer, M. Stampanoni, P. Cloetens, and, E. Ziegler, Opt. Express 13, 6296-6304 (2005).
11. F. Pfeiffer, O. Bunk, C. Kottler, C. Grünzweig, C. David, M. Bech, G. Le Duc, A. Bravin, and, P. Cloetens, Phys. Med. Biol. 52, 6923-6930 (2007).
12. C. David, J. Bruder, T. Rohbeck, C. Grünzweig, C. Kottler, A. Diaz, O. Bunk, and, F. Pfeiffer, Microelectron. Eng. 84, 1172-1177 (2007).
13. E. Reznikova, J. Mohr, M. Börner, V. Nazmov, and, P. J. Jakobs, Microsyst. Technol. 14, 1683-1688 (2008).
14. M. Sanchez del Rio, and, R. J. Dejus, in: Advances in Computational Methods for X-ray and Neutron Optics, edited by, M. Sanchez del Rio, Proc. SPIE, Vol. 5536 (SPIE, Bellingham, WA, USA, 2004), pp. 171-174.
15. D. C. Ghiglia, and, M. D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (Wiley, New York, 1998).
16. G. Schulz, T. Weitkamp, I. Zanette, F. Pfeiffer, F. Beckmann, C. David, S. Rutishauser, E. Reznikova, and, B. Müller, J. R. Soc. Interface 7 (53), 1665-1676 (2010).