Investigation on the origin of the giant dielectric constant in CaCu3Ti4O12 ceramics through analyzing CaCu3Ti4O12-HfO2 composites

Journal of the European Ceramic Society

Volumn 32, Issue 2, 2012, Pages 465-470

  Yuan, Wen Xiang ^a   Hark, S K ^a  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

A. Sintering; B. Composites; B. Grain size; C. Dielectric properties

Indexed keywords

A. SINTERING; ABNORMAL GRAIN GROWTH; B. COMPOSITES; B. GRAIN SIZE; C. DIELECTRIC PROPERTIES; DIELECTRIC CONSTANTS; DOMAIN BOUNDARY; END POINTS; EVOLUTION OF THE MICROSTRUCTURE; GIANT DIELECTRIC CONSTANTS; GRAIN SIZE; LOGARITHMIC LAW; TWO-COMPONENT; X-RAY DIFFRACTION STUDIES;

COARSENING; DIELECTRIC PROPERTIES; GRAIN BOUNDARIES; GRAIN GROWTH; GRAIN SIZE AND SHAPE; SCANNING ELECTRON MICROSCOPY; SINTERING; X RAY DIFFRACTION;

HAFNIUM OXIDES;

EID: 80055114969     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2011.09.021     Document Type: Article

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