Microstructural evolution and dielectric properties of Cu-deficient and Cu-excess CaCu3Ti4O12 ceramics

Materials Research Bulletin

Volumn 43, Issue 2, 2008, Pages 284-291

  Kim, Kang Min ^a   Lee, Jong Heun ^a   Lee, Kyung Min ^b   Kim, Doh Yeon ^b   Riu, Doh Hyung ^c   Lee, Sung Bo ^b  

^a Korea University   (South Korea)

^b Seoul National University   (South Korea)

^c Korea Institute of Ceramic Engineering and Technology (KICET)   (South Korea)

Author keywords

A. Electronic materials; A. Oxides; B. Dielectric properties

Indexed keywords

COPPER OXIDES; GRAIN GROWTH; MICROSTRUCTURAL EVOLUTION; PERMITTIVITY; PHASE INTERFACES;

ABNORMAL GRAIN GROWTH; ANGULAR GRAIN MORPHOLOGY; ELECTRONIC MATERIALS; INTERGRANULAR LIQUID PHASES;

CERAMIC MATERIALS;

EID: 37349068673     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2007.03.014     Document Type: Article

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