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Volumn 11, Issue 10, 2011, Pages 9260-9274

Analysis of deflection enhancement using epsilon assembly microcantilevers based sensors

Author keywords

Assembly; Deflection; Detection; Enhancement; Microcantilever

Indexed keywords

ARTICLE; ELECTRONICS; GENETIC PROCEDURES; INSTRUMENTATION; MATHEMATICAL COMPUTING; REPRODUCIBILITY;

EID: 80054999417     PISSN: 14248220     EISSN: None     Source Type: Journal    
DOI: 10.3390/s111009260     Document Type: Article
Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.