Low overhead program monitoring and profiling

ACM SIGPLAN/SIGSOFT Workshop on Program Analysis for Software Tools and Engineering

Volumn , Issue , 2005, Pages 28-34

  Kumar, Naveen ^a   Childers, Bruce R ^a   Soffa, Mary Lou ^b  

^a University of Pittsburgh   (United States)

^b University of Virginia   (United States)

Author keywords

dynamic binary translation; dynamic instrumentation; instrumentation optimization; profiling

Indexed keywords

ARCHITECTURE MODELING; DYNAMIC BINARY TRANSLATION; DYNAMIC INSTRUMENTATION; INSTRUMENTATION CODE; PROFILING; PROGRAM INSTRUMENTATIONS; PROGRAM INVARIANTS; PROGRAM MONITORING;

APPLICATION PROGRAMS; COMPUTER ARCHITECTURE; COMPUTER PROGRAMMING LANGUAGES; COST REDUCTION; EMBEDDED SYSTEMS; OPTIMIZATION; SEMANTICS;

INSTRUMENTS;

EID: 80054994109     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1108792.1108801     Document Type: Conference Paper

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