Photonic crystal fiber tip sensor for high-temperature measurement

IEEE Sensors Journal

Volumn 11, Issue 11, 2011, Pages 2643-2648

  Park, Bryan ^a   Provine, J ^a   Jung, Il Woong ^b   Howe, Roger T ^a   Solgaard, Olav ^a  

^a Stanford University   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Fiber tip sensor; GOPHER process; high temperature measurement; photonic crystal

Indexed keywords

FIBER TIP SENSOR; GOPHER PROCESS; HARSH ENVIRONMENT; HIGH SENSITIVITY; HIGH TEMPERATURE MEASUREMENT; HIGH-TEMPERATURE FIBERS; LONG PERIOD FIBER GRATING; PEAK SHIFT; REFLECTANCE SPECTRUM; SI WAFER; SINGLE-MASK; SINGLE-MODE OPTICAL FIBER; SPECTRAL SHIFT; TEMPERATURE RANGE; TEMPERATURE SENSITIVITY; WAVELENGTH RANGES;

FIBER BRAGG GRATINGS; FIBER OPTIC SENSORS; FIBERS; OPTICAL FIBER FABRICATION; PHOTONIC CRYSTALS; REFLECTION; SEMICONDUCTING SILICON COMPOUNDS; SENSORS; SILICON; SILICON WAFERS; STRUCTURE (COMPOSITION); TEMPERATURE MEASUREMENT;

PHOTONIC CRYSTAL FIBERS;

EID: 80054871209     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2011.2153844     Document Type: Article

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