Identification of the reconstruction and bonding structure of SiC nanocrystal surface by infrared spectroscopy

Applied Surface Science

Volumn 258, Issue 1, 2011, Pages 627-630

  Fan, J Y ^a   Li, H X ^b   Zhang, N ^a   Lu, R F ^b  

^a SOUTHEAST UNIVERSITY   (China)

^b NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

SiC quantum dot; Surface reconstruction; Surface structure

Indexed keywords

INFRARED SPECTROSCOPY; NANOCRYSTALS; SEMICONDUCTOR QUANTUM DOTS; SILICON CARBIDE; SILICON COMPOUNDS; SURFACE STRUCTURE;

BONDING STRUCTURE; CUBIC SIC NANOCRYSTALS; INFRARED SIGNAL; NANOCRYSTAL SURFACE; OXYGEN BRIDGE BONDS; SMALL PARTICLES; SURFACE BONDING STRUCTURE; WATER SOLVENTS;

SURFACE RECONSTRUCTION;

EID: 80054762013     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.06.116     Document Type: Article

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