SCOPUS 정보 검색 플랫폼

Applied Surface Science

Volumn 258, Issue 1, 2011, Pages 478-481

Fabrication and adhesion performance of gold conductive patterns on silicon substrate by laser sintering

(3) Cai, Zhixiang a Yung, K C b Zeng, Xiaoyan a

a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY (China)

b HONG KONG POLYTECHNIC UNIVERSITY (Hong Kong)

Author keywords

Adhesion; Gold conductive patterns; Laser sintering; Microstructure

Indexed keywords

ADHESION; GOLD; LASER HEATING; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SILICON; SINTERING; SPECTROMETERS; WIRE;

ADHESION MECHANISMS; ADHESION PERFORMANCE; CONDUCTIVE PATTERNS; ENERGY DISPERSIVE SPECTROMETERS; LASER SINTERED; LASER SINTERING; MICRO PARTICLES; SILICON SUBSTRATES;

SUBSTRATES;

EID: 80054747807 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2011.08.088 Document Type: Article

Times cited : (9)

References (17)

1
- 56149107570
- K.K.B. Hon, L. Li, and I.M. Hutchings CIRP Ann. Manuf. Technol. 57 2008 601
- (2008) CIRP Ann. Manuf. Technol. , vol.57 , pp. 601
- Hon, K.K.B.¹ Li, L.² Hutchings, I.M.³

2
- 0242636415
- J.P. Kruth, X. Wang, T. Laoui, and L. Froyen Assem. Autom. 23 2003 357
- (2003) Assem. Autom. , vol.23 , pp. 357
- Kruth, J.P.¹ Wang, X.² Laoui, T.³ Froyen, L.⁴

3
- 58149512278
- K.C. Yung, S.P. Wu, and H. Liem J. Mater. Sci. 44 2009 154
- (2009) J. Mater. Sci. , vol.44 , pp. 154
- Yung, K.C.¹ Wu, S.P.² Liem, H.³

4
- 32144432866
- H. Kim, R.C.Y. Auyeung, M. Ollinger, G.P. Kushto, and Z.H. Kafafi Appl. Phys. A 83 2006 73
- (2006) Appl. Phys. A , vol.83 , pp. 73
- Kim, H.¹ Auyeung, R.C.Y.² Ollinger, M.³ Kushto, G.P.⁴ Kafafi, Z.H.⁵

5
- 77955517172
- Y.H. Yoon, S.-M. Yi, J.-R. Yim, J.-H. Lee, G. Rozgonyi, and Y.-C. Joo Microelectron. Eng. 87 2010 2230
- (2010) Microelectron. Eng. , vol.87 , pp. 2230
- Yoon, Y.H.¹ Yi, S.-M.² Yim, J.-R.³ Lee, J.-H.⁴ Rozgonyi, G.⁵ Joo, Y.-C.⁶

6
- 65549114890
- Y.-T. Cheng, R.-H. Uang, Y.M. Wang, K.C. Chiou, and T.M. Lee Microelectron. Eng. 86 2009 865
- (2009) Microelectron. Eng. , vol.86 , pp. 865
- Cheng, Y.-T.¹ Uang, R.-H.² Wang, Y.M.³ Chiou, K.C.⁴ Lee, T.M.⁵

7
- 36249016730
- S.H. Ko, H. Pan, D.J. Hwang, J. Chung, S. Ryu, and C.P. Grigoropoulos J. Appl. Phys. 102 2007 093102
- (2007) J. Appl. Phys. , vol.102 , pp. 093102
- Ko, S.H.¹ Pan, H.² Hwang, D.J.³ Chung, J.⁴ Ryu, S.⁵ Grigoropoulos, C.P.⁶

8
- 33749476304
- S.H. Ko, Y. Choi, D.J. Hwang, and C.P. Grigoropoulos Appl. Phys. Lett. 89 2006 141126
- (2006) Appl. Phys. Lett. , vol.89 , pp. 141126
- Ko, S.H.¹ Choi, Y.² Hwang, D.J.³ Grigoropoulos, C.P.⁴

9
- 1642294101
- J. Wang, N.R. Sottos, and R.L. Weaver J. Mech. Phys. Solids 52 2004 999
- (2004) J. Mech. Phys. Solids , vol.52 , pp. 999
- Wang, J.¹ Sottos, N.R.² Weaver, R.L.³

10
- 34047272508
- C.H. Wei, and J.-Y. Yen Diamond Relat. Mater. 16 2007 1325
- (2007) Diamond Relat. Mater. , vol.16 , pp. 1325
- Wei, C.H.¹ Yen, J.-Y.²

11
- 65149083819
- A. Sridhar, D.J. van Dijk, and R. Akkerman Thin Solid Films 517 2009 4633
- (2009) Thin Solid Films , vol.517 , pp. 4633
- Sridhar, A.¹ Van Dijk, D.J.² Akkerman, R.³

12
- 56949083063
- Y.C. Lin, W.Q. Shi, and Z.Z. Chen Thin Solid Films 517 2009 1701
- (2009) Thin Solid Films , vol.517 , pp. 1701
- Lin, Y.C.¹ Shi, W.Q.² Chen, Z.Z.³

13
- 65549115546
- T. Ishida, Y. Nakajima, J.J. Endo, D. Collard, and H. Fujita Nanotechnology 20 2009 065705
- (2009) Nanotechnology , vol.20 , pp. 065705
- Ishida, T.¹ Nakajima, Y.² Endo, J.J.³ Collard, D.⁴ Fujita, H.⁵

14
- 0036896539
- H. Miyake, S. Ye, and M. Osawa Electrochem. Commun. 4 2002 973
- (2002) Electrochem. Commun. , vol.4 , pp. 973
- Miyake, H.¹ Ye, S.² Osawa, M.³

15
- 0000801888
- E. Landree, D. Grozea, C. Collazo-Davila, and L.D. Marks Phys. Rev. B 55 1997 7910
- (1997) Phys. Rev. B , vol.55 , pp. 7910
- Landree, E.¹ Grozea, D.² Collazo-Davila, C.³ Marks, L.D.⁴

16
- 75249087085
- S. Joo, and D.F. Baldwin Nanotechnology 21 2010 55204
- (2010) Nanotechnology , vol.21 , pp. 55204
- Joo, S.¹ Baldwin, D.F.²

17
- 51449102625
- S. Joo, and D.F. Baldwin Electron. Comp. Tech. Conf. 2 2008 1417
- (2008) Electron. Comp. Tech. Conf. , vol.2 , pp. 1417
- Joo, S.¹ Baldwin, D.F.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.