Dielectric properties of Nb-doped CaCu3Ti4O12 electroceramics measured at high frequencies

Journal of Alloys and Compounds

Volumn 493, Issue 1-2, 2010, Pages 486-492

  Sulaiman, Muhammad Azwadi ^a   Hutagalung, Sabar D ^a   Ain, Mohd Fadzil ^b   Ahmad, Zainal A ^a  

^a SCHOOL OF MATERIALS AND MINERAL RESOURCES ENGINEERING   (Malaysia)

^b SCHOOL OF PHYSICS   (Malaysia)

Author keywords

Ceramics; Dielectric response; Scanning electron microscopy; Sintering; Solid state reaction; X ray diffraction

Indexed keywords

ABNORMAL GRAIN GROWTH; CERAMICS; DIELECTRIC CONSTANTS; DIELECTRIC RESPONSE; DOPANT LEVELS; ELECTROCERAMICS; FREQUENCY RANGES; HIGH FREQUENCY; NORMAL GRAIN GROWTH; SOLID STATE REACTION METHOD; X RAY DIFFRACTOMETERS;

CALCIUM ALLOYS; CERAMIC MATERIALS; DIELECTRIC LOSSES; DIFFRACTION; DOPING (ADDITIVES); GRAIN SIZE AND SHAPE; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SINTERING; SOLID STATE REACTIONS; X RAY DIFFRACTION;

GRAIN GROWTH;

EID: 77249116643     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.12.137     Document Type: Article

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