Correlation between the trap state spectra and dielectric behavior of CaCu3Ti4O12

Journal of Materials Research

Volumn 26, Issue 1, 2011, Pages 36-44

  Barner K ^a   Luo, X J ^b   Song, X P ^b   Hang, C ^b   Chen, S S ^b   Medvedeva, I V ^c   Yang, C P ^b,d  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b HUBEI UNIVERSITY   (China)

^c INSTITUTE OF METAL PHYSICS   (Russian Federation)

^d YANSHAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED TRAPS; DIELECTRIC BEHAVIOR; DIELECTRIC RESPONSE; PEROVSKITE OXIDES; TEMPERATURE DEPENDENCE; TRAP STATE;

DIELECTRIC LOSSES; MANGANESE; PEROVSKITE;

RELAXATION PROCESSES;

EID: 79952418390     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2010.46     Document Type: Article

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