Fe3O4 on ZnO: A spectroscopic study of film and interface properties

Thin Solid Films

Volumn 520, Issue 1, 2011, Pages 368-373

  Muller A ^a   Ruff, A ^a   Paul, M ^a   Wetscherek, A ^a   Berner, G ^a   Bauer, U ^a   Praetorius, C ^a   Fauth, K ^a   Przybylski, M ^b   Gorgoi, M ^c   Sing, M ^a   Claessen, R ^a  

^a UNIVERSITY OF WÜRZBURG   (Germany)

^b AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^c HAHN MEITNER INSTITUT   (Germany)

Author keywords

Iron oxide; Low energy electron diffraction; Magnetite; Photoemission; X ray magnetic circular dichroismHard X ray Photoelectron Spectroscopy; X ray Photoelectron Spectroscopy; Zinc oxide

Indexed keywords

FILM QUALITY; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; IN-PLANE MAGNETIZATION; INTERFACE PROPERTY; LOW ENERGY ELECTRONS; MAGNETITE THIN FILMS; MAGNETO-OPTICAL KERR EFFECTS; NON DESTRUCTIVE; OXYGEN PARTIAL PRESSURE; PRESSURE VARIATIONS; SPECTROSCOPIC STUDIES; X-RAY MAGNETIC CIRCULAR DICHROISM; X-RAY MAGNETIC CIRCULAR DICHROISMHARD X-RAY PHOTOELECTRON SPECTROSCOPY; ZNO;

BALLOONS; CIRCULAR DICHROISM SPECTROSCOPY; DEPTH PROFILING; DICHROISM; DIFFRACTION; ELECTRONS; EMISSION SPECTROSCOPY; EPITAXIAL GROWTH; FILM GROWTH; IRON ORES; IRON OXIDES; KERR MAGNETOOPTICAL EFFECT; LOW ENERGY ELECTRON DIFFRACTION; MAGNETIC PROPERTIES; MAGNETITE; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; OPTICAL KERR EFFECT; OXIDE FILMS; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTONS; THIN FILMS; ZINC; ZINC OXIDE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 80054051694     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.07.023     Document Type: Article

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