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Volumn 130, Issue 3, 2011, Pages 1061-1065
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Controlled synthesis and characteristics of antireflection coatings of TiO2 produced from a organometallic colloid
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Author keywords
AFM; Antireflection coatings; Optical properties; Silcon solar cells; Thin films; Titanium dioxide; XPS
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Indexed keywords
ACETYLACETONATES;
AFM;
ANTI-REFLECTION;
ANTIREFLECTION LAYERS;
COATING THICKNESS;
COLLOIDAL PRECURSORS;
CONTROLLED SYNTHESIS;
OPTICAL CHARACTERISTICS;
POST-DEPOSITION;
SILCON SOLAR CELLS;
SINTERING DURATIONS;
SINTERING TEMPERATURES;
SOL-GEL SPIN-COATING PROCESS;
SPIN RATE;
TIO;
TITANIUM CONTENT;
UV-VIS SPECTROSCOPY;
X-RAY DIFFRACTION TECHNIQUES;
ATOMIC FORCE MICROSCOPY;
ATOMIC SPECTROSCOPY;
COATINGS;
MONOCRYSTALLINE SILICON;
ORGANOMETALLICS;
OXIDES;
PHOTOELECTRON SPECTROSCOPY;
REFRACTIVE INDEX;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON WAFERS;
SINTERING;
SOL-GEL PROCESS;
THICKNESS MEASUREMENT;
TITANIUM;
TITANIUM DIOXIDE;
ULTRAVIOLET SPECTROSCOPY;
X RAY DIFFRACTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
ANTIREFLECTION COATINGS;
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EID: 80054030402
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matchemphys.2011.08.035 Document Type: Article |
Times cited : (11)
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References (20)
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