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Volumn 208, Issue 10, 2011, Pages 2399-2405

Structural characterization of CuInS 2 thin films from Cu-In metal inks

Author keywords

Raman spectroscopy; solar cells; thin films; XPS

Indexed keywords

COMPOSITIONAL CHANGES; DIFFUSION RATE; DIFFUSION-LIMITED PROCESS; EX SITU; IMPURITY PHASE; IN-CONTROL; INTERMEDIATE PHASIS; METAL INKS; PRECURSOR FILMS; STRUCTURAL CHARACTERIZATION; STRUCTURAL QUALITIES; SULFURIZATION TEMPERATURE; XRD;

EID: 80054009418     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201026782     Document Type: Article
Times cited : (9)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.