Recorded low power dissipation in highly reliable 1060-nm VCSELs for green optical interconnection

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 17, Issue 6, 2011, Pages 1614-1620

  Imai, Suguru ^a   Takaki, Keishi ^a   Kamiya, Shinichi ^a   Shimizu, Hitoshi ^a   Yoshida, Junji ^a   Kawakita, Yasumasa ^a   Takagi, Tomohiro ^a   Hiraiwa, Koji ^a   Shimizu, Hiroshi ^a   Suzuki, Toshihito ^a   Iwai, Norihiro ^a   Ishikawa, Takuya ^a   Tsukiji, Naoki ^a   Kasukawa, Akihiko ^a  

^a FURUKAWA ELECTRIC CO LTD   (Japan)

Author keywords

Optical interconnection; power dissipation; reliability; vertical cavity surface emitting laser (VCSEL)

Indexed keywords

AGING TESTS; CONFIDENCE LEVELS; DATA RATES; EXTINCTION RATIOS; HIGH RELIABILITY; INPUT SIGNAL; INTRACAVITIES; LOW-POWER DISSIPATION; MODULATION AMPLITUDES; RANDOM FAILURES; VERTICAL-CAVITY SURFACE EMITTING LASER;

ENERGY DISSIPATION; OPTICAL INTERCONNECTS; RELIABILITY; SURFACE EMITTING LASERS; TESTING;

ELECTRIC LOSSES;

EID: 80054001804     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2011.2114643     Document Type: Article

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