Highly reliable high-speed 1.1-μm-range VCSELs with InGaAs/GaAsP-MQWs

IEEE Journal of Quantum Electronics

Volumn 46, Issue 6, 2010, Pages 890-897

  Hatakeyama, Hiroshi ^a   Anan, Takayoshi ^a   Akagawa, Takeshi ^a   Fukatsu, Kimiyoshi ^a   Suzuki, Naofumi ^a   Tokutome, Keiichi ^a   Tsuji, Masayoshi ^a  

^a NEC CORPORATION   (Japan)

Author keywords

Optical interconnections; Reliability; Strain compensated MQWs; Vertical cavity surface emitting laser

Indexed keywords

ACCELERATED LIFE TESTS; ACTIVE LAYER; AMBIENT TEMPERATURES; CURRENT APERTURES; DARK-LINES; DBR LAYERS; ERROR FREE OPERATIONS; HIGH DATA RATE; HIGH TEMPERATURE; HIGH-SPEED; LONG LIFETIME; MULTIPLE QUANTUM WELLS; OPTICAL INTERCONNECTIONS; STRAIN-COMPENSATED; VERTICAL-CAVITY SURFACE EMITTING LASER;

FAILURE ANALYSIS; LASERS; MICROOPTICS; OPTICAL INTERCONNECTS; OPTICAL WAVEGUIDES; QUANTUM WELL LASERS; SEMICONDUCTOR QUANTUM WELLS; TESTING;

SURFACE EMITTING LASERS;

EID: 77949361365     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2010.2040583     Document Type: Article

References (19)

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