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Physical Review Letters

Volumn 107, Issue 16, 2011, Pages

Nanoscale optical electrometer

(6) Vamivakas, A N a Zhao, Y a,b Falt S c Badolato, A d Taylor, J M e,f Atature M a

a UNIVERSITY OF CAMBRIDGE (United Kingdom)

b UNIVERSITY OF HEIDELBERG (Germany)

c Sol Voltaics AB (Sweden)

d UNIVERSITY OF ROCHESTER (United States)

e MASSACHUSETTS INSTITUTE OF TECHNOLOGY (United States)

f NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALL-OPTICAL; BACKACTION; DIFFRACTION LIMITED; MEASURED SYSTEM; NANO SCALE; SINGLE ELECTRON; SPOT SIZES;

ELECTROMETERS; LASER EXCITATION; SEMICONDUCTOR QUANTUM DOTS;

QUANTUM DOT LASERS;

EID: 80053999841 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.107.166802 Document Type: Article

Times cited : (59)

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