Enhanced gas sensing properties of p-type TeO2 nanorods functionalized with Pd

Nano

Volumn 6, Issue 5, 2011, Pages 455-460

  Kim, Hyunsu ^a   Park, Sunghoon ^a   Jin, Changhyun ^a   Lee, Chongmu ^a  

^a Inha University   (South Korea)

Author keywords

gas sensor; Nanorods; NO2; Pd functionlization; TeO2

Indexed keywords

AVERAGE DIAMETER; FACE-CENTERED CUBIC; FUNCTIONALIZATIONS; FUNCTIONALIZED; GAS SENSING PROPERTIES; MONOCRYSTALLINE; NANOCRYSTALLINES; P-TYPE; PD NANO PARTICLE; PD-FUNCTIONLIZATION; PHOTO-REDUCTION; RECOVERY TIME; SCANNING ELECTRON MICROSCOPY IMAGE; SENSING PROPERTY; TEO2; THREE-STEP PROCESS;

GAS DETECTORS; NANOPARTICLES; NITROGEN OXIDES; SCANNING ELECTRON MICROSCOPY; SENSORS; THERMAL EVAPORATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

NANORODS;

EID: 80053987201     PISSN: 17932920     EISSN: None     Source Type: Journal    
DOI: 10.1142/S1793292011002858     Document Type: Article

References (27)

1. J. G. Lu, P. Chang and Z. Fan, Mater. Sci. Eng. B 53, 49 (2006).
2. A. Liu, Biosens. Bioelectron. 24, 167 (2008).
3. Y.-H. Lin, M.-W. Huang, C.-K. Liu, J.-R. Chen, J.-M. Wu and H. C. Shih, J. Electrochem. Soc. 156, K196 (2009).
4. N. S. Ramgir, I. S. Mulla and K. P. Vijayamohanan, Sens. Actuat. B 107, 708 (2005).
5. Q. Wan and T. H. Wang, Chem. Commun., 3841 (2005).
6. A. Kolmakov, D. O. Klenov, Y. Lilach, S. Stemmer and M. Moskovits, Nano Lett. 5, 667 (2005).
7. Q. Kuang, C. S. Lao, Z. Li, Y. Z. Liu, Z. X. Xie, L. S. Zheng and Z. L.Wang, J. Phys. Chem. C 112, 11539 (2008).
8. J. S. Wright, W. Lim, B. P. Gila, S. J. Pearton, J. L. Johnson, A. Ural and F. Ren, Sens. Actuat. B 140, 196 (2009).
9. X. Xue, L. Xing, Y. Chen, S. Shi, Y. Wang and T. Wang, J. Phys. Chem. C 112, 12157 (2008).
10. Y.-J. Chen, C.-L. Zhu, L.-J. Wang, P. Cao, M.-S. Cao and X.-L. Shi, Nanotechnology 20, 045502 (2009).
11. J. Y. Park, S. W. Choi, J. W. Lee, C. Lee and S. S. Kim, J. Am. Ceram. Soc. 92, 2551 (2009).
12. A. W. Warner, D. L. White and W. A. Bonner, J. Appl. Phys. 43, 4489 (1972).
13. S. N. Antonov, Tech. Phys. 49, 1329 (2004).
14. K. Arshak and O. Korostynska, Mater. Sci. Eng. B 107, 224 (2004).
15. K. Arshak and O. Korostynska, Sensors 2, 347 (2002).
16. S. N. B. Hodgson and L.Weng, J. Sol-Gel Sci. Technol. 18, 145 (2000).
17. S. N. B. Hodgson and L. Weng, J. Mater. Sci.: Mater. Electron. 17, 723 (2006).
18. Z. Liu, T. Yamazaki, Y. Shen, T. Kikuta and N. Nakatani, Jpn. J. Appl. Phys. 47, 771 (2008).
19. Z. Liu, T. Yamazaki, Y. Shen, T. Kikuta, N. Nakatani and T. Kawabata, Appl. Phys. Lett. 90, 173119 (2007).
20. Z. Liu, T. Yamazaki, Y. Shen and T. Kikuta, Appl. Phys. Lett. 90, 173119 (2007).
21. H. Jain and A. S. Nowick, Phys. Stat. Sol. A 67, 701 (1981).
22. P. Yang and C. M. Lieber, Science 273, 1836 (1996).
23. A. Kolmakov, D. O. Klenov, Y. Lilach, S. Stemmer and M. Moskovits, Nano Lett. 5, 667 (2005).
24. T. B. Fryberger and S. Semancik, Sens. Actuat. B 2, 305 (1990).
25. T. Gao and T. H. Wang, Appl. Phys. A: Mater. Sci. Process. 80, 1451 (2005).
26. B. Tian, X. Zheng, T. J. Kempa, Y. Fang, N. Yu, G. Yu, J. Huang and C. M. Lieber, Nature 449, 885 (2007).
27. L. Mai, L. Xu, Q. Gao, C. Han, B. Hu and Y. Pi, Nano Lett. 10, 2604 (2010).