Highly sensitive molecular detection with swift heavy ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 269, Issue 20, 2011, Pages 2251-2253

  Wakamatsu, Yoshinobu ^a   Yamada, Hideaki ^a   Ninomiya, Satoshi ^a,b   Jones, Brian N ^c   Seki, Toshio ^a,b   Aoki, Takaaki ^a,b   Webb, Roger ^c   Matsuo, Jiro ^a,b  

^a KYOTO UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

Biomolecules; Electronic sputtering; Secondary ion emission; SIMS; Swift heavy ion

Indexed keywords

BIOLOGICAL IMAGING; BIOLOGICAL SAMPLES; CLUSTER IONS; DENSE ELECTRONIC EXCITATION; ELECTRONIC SPUTTERING; FISSION FRAGMENT; HIGH ENERGY; HIGH SPATIAL RESOLUTION; HIGH YIELD; HIGHER YIELD; HIGHLY SENSITIVE; ION COLLISIONS; LOW SENSITIVITY; MICRO BEAMS; MOLECULAR DETECTION; MOLECULAR DISTRIBUTION; MOLECULAR IONS; PLASMA DESORPTION; PRIMARY IONS; SECONDARY ION EMISSION; SECONDARY ION YIELD; SENSITIVE DETECTION; SOFT IONIZATION METHODS; SWIFT HEAVY IONS;

AMINO ACIDS; BIOMOLECULES; BISMUTH; DESORPTION; HEAVY IONS; HIGH ENERGY PHYSICS; IMAGING TECHNIQUES; ION SOURCES; IONIZATION; MICROCHANNELS; MOLECULAR BIOLOGY; MOLECULES; PHOSPHOLIPIDS; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY;

SECONDARY EMISSION;

EID: 80053562738     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2011.02.069     Document Type: Conference Paper

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