Yield enhancement of molecular ions with MeV ion-induced electronic excitation

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 1591-1594

  Nakata, Y ^a   Honda, Y ^a   Ninomiya, S ^a   Seki, T ^a,b   Aoki, T ^a,b   Matsuo, J ^a,b  

^a KYOTO UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Biomolecule; Electronic excitation; Mass spectrometry; MeV energy; Secondary ion

Indexed keywords

AMINO ACIDS; ARGININE; BIOMOLECULES; DESORPTION; ENERGY DISSIPATION; ION SOURCES; IONS; MASS SPECTROMETRY; NUCLEAR ENERGY; PROTONATION; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY;

ELECTRONIC ENERGY LOSS; ELECTRONIC EXCITATION; MEV ENERGY; MOLECULAR FRAGMENTATION; NEAR SURFACE REGIONS; NUCLEAR ENERGY DEPOSITION; ORDERS OF MAGNITUDE; SECONDARY IONS;

NUCLEAR REACTIONS;

EID: 56449106828     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.108     Document Type: Article

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