Impedance spectroscopy of bilayered bismuth ferrite thin films

Journal of Applied Physics

Volumn 110, Issue 6, 2011, Pages

  Wu, Jiagang ^a   Wang, John ^b   Xiao, Dingquan ^a   Zhu, Jianguo ^a  

^a SICHUAN UNIVERSITY   (China)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; BISMUTH FERRITES; CONDUCTION MECHANISM; DEFECT CONCENTRATIONS; DIELECTRIC BEHAVIOR; DIFFERENT THICKNESS; ELECTRICAL CONDUCTION; IMPEDANCE SPECTROSCOPY; POLYCRYSTALLINE STRUCTURE; RADIO FREQUENCY SPUTTERING; RANDOM GRAINS; RANDOM ORIENTATIONS; SCALING BEHAVIOR; SILICON SUBSTRATES; THICKNESS RATIO;

BISMUTH; DIELECTRIC RELAXATION; FERRITES; OXYGEN VACANCIES; PLATINUM; ZINC;

ELECTRIC PROPERTIES;

EID: 80053538817     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3636390     Document Type: Article

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