Baseline correction methods to deal with artifacts in femtosecond transient absorption spectroscopy

Analytica Chimica Acta

Volumn 705, Issue 1-2, 2011, Pages 64-71

  Devos, Olivier ^a   Mouton, Nicolas ^a   Sliwa, Michel ^a   Ruckebusch, Cyril ^a  

^a UNIV LILLE   (France)

Author keywords

Artifact; Asymmetric least squares; Pre processing; Time resolved spectroscopy; Wavelet

Indexed keywords

DATA HANDLING; DISCRETE WAVELET TRANSFORMS; LASER SPECTROSCOPY; MULTIVARIANT ANALYSIS;

ARTIFACT; ASYMMETRIC LEAST SQUARES; PRE-PROCESSING; TIME-RESOLVED SPECTROSCOPY; WAVELET;

ABSORPTION SPECTROSCOPY;

ABSORPTION SPECTROSCOPY; ANALYTICAL PARAMETERS; ARTICLE; ARTIFACT REDUCTION; ASYMMETRIC PENALIZED LEAST SQUARE; CONTROLLED STUDY; DATA ANALYSIS; DISCRETE WAVELET TRANSFORM; FEMTOSECOND PUMP PROBE SPECTROSCOPY; FEMTOSECOND TRANSIENT ABSORPTION SPECTROSCOPY; INTERMETHOD COMPARISON; MULTIVARIATE ANALYSIS; PRIORITY JOURNAL; SIMULATION; TECHNIQUE;

EID: 80053384232     PISSN: 00032670     EISSN: 18734324     Source Type: Journal    
DOI: 10.1016/j.aca.2011.04.013     Document Type: Article

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